Intelligent Electronics & Metrology (IEM) is a fully open-access academic journal. All published articles are immediately and permanently available to global readers, researchers, and academic institutions without paywalls, subscription fees, registration restrictions, or embargo periods, complying with international open-access publishing standards.

Subscription Service: Although all journal content is freely accessible to the public, IEM provides customized institutional subscription and academic cooperation services for universities, research institutes, and academic libraries. Institutional subscribers can obtain official full-text resource authorization, annual journal volume data packages, new issue push notifications, and exclusive bibliometric statistics support. Individual readers do not need paid subscriptions to browse, download, and cite all published manuscripts.

Permanent Journal Archives: IEM maintains a complete, standardized, and permanent online archive covering all formally published manuscripts since the journal’s launch. All articles are systematically categorized and archived by publication year, volume, and issue, ensuring standardized academic filing and traceable academic records.

The journal archive database is updated in real time with the release of each new issue, continuously enriching historical literature resources. Readers can freely retrieve, browse, download, and reference all archived papers via the official website. All archived content adheres to long-term data preservation specifications to guarantee the stability, integrity, and inheritability of academic research achievements in the fields of intelligent electronics and precision metrology.

For institutional subscription authorization, archive data cooperation, and resource docking inquiries, please contact the IEM editorial office through the official email channel.