Intelligent Electronics & Metrology

Founded: 2026 | Quarterly Open Access Journal
Editor-in-Chief: Prof. Xufeng Jing
Editorial Board

About The Journal

《Intelligent Electronics & Metrology》(IEM) is an international academic journal. Positioned at the forefront of intelligent electronics, metrology, testing, physics and interdisciplinary fields, the journal focuses on cutting-edge theories, innovative technologies, application practices and industry reviews. It mainly publishes original research papers, review articles and frontier news briefs in directions such as intelligent algorithm-enabled physical electronics research, intelligent material physics, quantum intelligent physics, intelligent sensing and physical detection, and the integration of computational physics and artificial intelligence.

Rooted in academic frontiers and open to global submissions, IEM is committed to becoming a core academic platform in the interdisciplinary field of intelligent electronic metrology at home and abroad.

Editor-in-Chief

Editor-in-Chief: Xufeng Jing
China JiLiang University
jingxufeng@cjlu.edu.cn

Editorial Board Members

Editor: Haomiao Zhou
China JiLiang University
zhouhm@cjlu.edu.cn

Editorial Board Members

Editor: Haiyong Gan
National Institute of Metrology,China
ganhaiyong@nim.ac.cn
Editor: YuQiang Deng
National Institute of Metrology,China
yqdeng@nim.ac.cn
Editor: Wenren Zhu
Shanghai Jiao Tong University
weiren.zhu@sjtu.edu.cn
Editor: Huihui Zhu
Zhejiang University
huihui001@zju.edu.cn
Editor: Chenglong Zheng
Zhenzhou University
clzheng@zzu.edu.cn
Editor: Xiaoyong He
Shanghai Normal University
xyhe@shnu.edu.cn
Editor: YingTian
China Jiliang University
tianying@cjlu.edu.cn
Editor: Yixi Huang
Sichuan Normal University
bradbiubiu@sicnu.edu.cn
Editor: Jie Li
Chengdu University of Information Technology
lijie@cuit.edu.cn
Editor: Jitao Li
Southwest Petroleum University
jtlee@swpu.edu.cn
Editor: Chee Leong Tan
Portland State University
chee@pdx.edu

Open Access Copyright Statement

Intelligent Electronics & Metrology (IEM) is an open-access academic journal. All formally accepted and published manuscripts are available for free online reading, downloading, citing and sharing by global users. The journal adopts standardized open-access publishing specifications. All published articles comply with international open-access academic norms, ensuring the maximum dissemination and academic exchange of research achievements. Authors retain the copyright of their original papers, while the journal obtains the exclusive first publication right and standardized dissemination right of the manuscripts. Without illegal modification, commercial use or unauthorized reprinting, users can freely utilize the published academic achievements for non-commercial academic research and teaching purposes. The journal strictly safeguards the academic copyright and legitimate rights and interests of authors, and standardizes the open dissemination and use of all published contents.

Legal Statement

All publishing rights, distribution rights, intellectual property rights and other legitimate related rights and interests of the journal Intelligent Electronics & Metrology are exclusively and legally owned by Hong Kong Zhongke Huasheng Publishing Company Limited. The journal is fully and independently operated, managed and maintained by the company, including manuscript solicitation, editing, publication, distribution, online communication and all related derivative businesses of the journal. Without formal written authorization from the company, no institution or individual may illegally reprint, copy, extract, tamper with or disseminate all or part of the journal content, nor use the journal content for any commercial, infringing or irregular purposes. Hong Kong Zhongke Huasheng Publishing Company Limited independently bears all legal liabilities related to the operation and publication of the journal in accordance with relevant laws and regulations, strictly abides by relevant publishing rules and intellectual property protection provisions, and reserves all rights of interpretation, maintenance and legal protection concerning the rights and interests of this journal.