About the Journal

Intelligent Electronics & Metrology (IEM) is an international academic journal positioned at the forefront of intelligent electronics, metrology, testing, physics, and interdisciplinary fields. The journal focuses on cutting-edge theories, innovative technologies, application practices, and industry reviews, committed to becoming a core academic platform in the interdisciplinary field of intelligent electronic metrology both domestically and internationally.

IEM is a fully open-access journal. All formally accepted and published manuscripts are available for free online reading, downloading, citing, and sharing by global users, ensuring the maximum dissemination and academic exchange of research achievements.

Topics of Interest

IEM mainly publishes original research papers, review articles, and frontier news briefs in the following directions:

• Intelligent algorithm-enabled physical electronics research
• Intelligent material physics
• Quantum intelligent physics
• Intelligent sensing and physical detection
• Integration of computational physics and artificial intelligence
• Emerging interdisciplinary topics in intelligent electronics and metrology

Submission Guidelines

All manuscripts must be original, unpublished, and not under consideration for publication elsewhere.

Join Us at the Frontier

We cordially invite researchers, scholars, and practitioners worldwide to contribute their latest findings to IEM and join us in advancing the frontiers of intelligent electronics and precision metrology.